S. Redmond, Chris Heneghan. A Non-parametric Dimensionality Reduction Technique Using Gradient Descent of Misclassification Rate. In Sameer Singh, Maneesha Singh, Chidanand Apté, Petra Perner, editors, Pattern Recognition and Image Analysis, Third International Conference on Advances in Pattern Recognition, ICAPR 2005, Bath, UK, August 22-25, 2005, Proceedings, Part II. Volume 3687 of Lecture Notes in Computer Science, pages 155-164, Springer, 2005. [doi]
Abstract is missing.