Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks

Gilles Reimbold, J. Mitard, X. Garros, Charles Leroux, G. Ghibaudo, F. Martin. Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks. Microelectronics Reliability, 47(4-5):489-496, 2007. [doi]

Abstract

Abstract is missing.