Rosa D. Reinosa, Aileen Allen, Elizabeth Benedetto, Alan Mcallister. Characterizing mechanical performance of Board Level Interconnects for In-Circuit Test. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 495-505, IEEE, 2010. [doi]
Abstract is missing.