Uljana Reinsalu, Jaan Raik, Raimund Ubar, Peeter Ellervee. Fast RTL Fault Simulation Using Decision Diagrams and Bitwise Set Operations. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 164-170, IEEE, 2011. [doi]
Abstract is missing.