Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva. Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electronic Testing, 28(6):877-883, 2012. [doi]
@article{RenFCWWVWB12,
title = {Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter},
author = {Yi Ren and L. Fan and Li Chen and Shi-Jie Wen and Richard Wong and N. W. van Vonno and Arthur F. Witulski and Bharat L. Bhuva},
year = {2012},
doi = {10.1007/s10836-012-5338-8},
url = {http://dx.doi.org/10.1007/s10836-012-5338-8},
researchr = {https://researchr.org/publication/RenFCWWVWB12},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {28},
number = {6},
pages = {877-883},
}