Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS - researchr publication

researchr

You are not signed in
Sign in
Sign up

David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong. Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. on Circuits and Systems, 59-I(8):1626-1634, 2012. [doi]

Abstract is missing.

runs on WebDSL