Jason D. Rennie, Lawrence Shih, Jaime Teevan, David R. Karger. Tackling the Poor Assumptions of Naive Bayes Text Classifiers. In Tom Fawcett, Nina Mishra, editors, Machine Learning, Proceedings of the Twentieth International Conference (ICML 2003), August 21-24, 2003, Washington, DC, USA. pages 616-623, AAAI Press, 2003.
Abstract is missing.