Evidence and Scenario Sensitivities in Naive Bayesian Classifiers

Silja Renooij, Linda C. van der Gaag. Evidence and Scenario Sensitivities in Naive Bayesian Classifiers. In Milan StudenĂ˝, JirĂ­ Vomlel, editors, Third European Workshop on Probabilistic Graphical Models, 12-15 September 2006, Prague, Czech Republic. Electronic Proceedings. pages 255-262, 2006. [doi]

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