Analyzing the test generation problem for an application-oriented test of FPGAs

Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian. Analyzing the test generation problem for an application-oriented test of FPGAs. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 75-80, IEEE Computer Society, 2000. [doi]

Abstract

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