Marco Restifo, Paolo Bernardi, S. De Luca, Alessandro Sansonetti. On-line software-based self-test for ECC of embedded RAM memories. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.