Impact of gate drive voltage on avalanche robustness of trench IGBTs

Michele Riccio, L. Maresca, Andrea Irace, Giovanni Breglio, Yohei Iwahashi. Impact of gate drive voltage on avalanche robustness of trench IGBTs. Microelectronics Reliability, 54(9-10):1828-1832, 2014. [doi]

Abstract

Abstract is missing.