M. Riccio, A. Pantellini, Andrea Irace, Giovanni Breglio, A. Nanni, Claudio Lanzieri. Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology. Microelectronics Reliability, 51(9-11):1725-1729, 2011. [doi]
@article{RiccioPIBNL11,
title = {Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology},
author = {M. Riccio and A. Pantellini and Andrea Irace and Giovanni Breglio and A. Nanni and Claudio Lanzieri},
year = {2011},
doi = {10.1016/j.microrel.2011.07.003},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.003},
researchr = {https://researchr.org/publication/RiccioPIBNL11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1725-1729},
}