Javier Rivera-Castillo, Moises Rivas-López, Juan I. Nieto-Hipólito, Oleg Sergiyenko, Wendy Flores-Fuentes, Daniel Hernandez Balbuena, Julio C. Rodríguez-Quiñonez, Jesus A. Platt-Carrillo. Structural Health Monitoring based on Optical Scanning Systems and SVM. In IEEE 23rd International Symposium on Industrial Electronics, ISIE 2014, Istanbul, Turkey, June 1-4, 2014. pages 1961-1966, IEEE, 2014. [doi]
Abstract is missing.