R. Robache, J.-F. Boland, Claude Thibeault, Yvon Savaria. A methodology for system-level fault injection based on gate-level faulty behavior. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.