Gordon W. Roberts. Test Methods For Sigma-Delta Data Converters and Related Devices. In Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta, editors, Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008. pages 3, ACM, 2008. [doi]
Abstract is missing.