Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
R. Rodríguez, M. Porti, M. Nafría, X. Aymerich. Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO::2:: films. Microelectronics Reliability, 41(7):1011-1013, 2001. [doi]