Optical sensor process variability in a 0.18 μm high voltage CMOS technology

Frederic Roger, Anderson Pires Singulani, Jong Mun Park. Optical sensor process variability in a 0.18 μm high voltage CMOS technology. In 27th International Symposium on Power and Timing Modeling, Optimization and Simulation, PATMOS 2017, Thessaloniki, Greece, September 25-27, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

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