A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting

Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro. A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing, 22(4-6):325-335, 2006. [doi]

Abstract

Abstract is missing.