Multivariable control of a metrological Atomic Force Microscope

Michael J. C. Ronde, Roel J. E. Merry, Marinus Jacobus Gerardus van de Molengraft, Richard K. Koops, Maarten Steinbuch. Multivariable control of a metrological Atomic Force Microscope. In European Control Conference, ECC 2009, Budapest, Hungary, 23-26 August 2009. pages 2265-2270, IEEE, 2009. [doi]

Abstract

Abstract is missing.