Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Luciano Ost, Ricardo Reis. Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 137-140, IEEE, 2015. [doi]
Abstract is missing.