Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Elyse Rosenbaum, Jie Wu. Trap generation and breakdown processes in very thin gate oxides. Microelectronics Reliability, 41(5):625-632, 2001. [doi]