Influence of different carbon doping on the performance and reliability of InAlN/GaN HEMTs

Isabella Rossetto, Fabiana Rampazzo, Matteo Meneghini, M. Silvestri, Christian Dua, Piero Gamarra, Raphael Aubry, Marie-Antoinette di Forte-Poisson, O. Patard, Sylvain L. Delage, Gaudenzio Meneghesso, Enrico Zanoni. Influence of different carbon doping on the performance and reliability of InAlN/GaN HEMTs. Microelectronics Reliability, 54(9-10):2248-2252, 2014. [doi]

Authors

Isabella Rossetto

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Fabiana Rampazzo

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Matteo Meneghini

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M. Silvestri

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Christian Dua

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Piero Gamarra

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Raphael Aubry

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Marie-Antoinette di Forte-Poisson

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O. Patard

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Sylvain L. Delage

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Gaudenzio Meneghesso

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Enrico Zanoni

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