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A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing

Lucio Rossi, M. Riccio, E. Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito. A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing. Microelectronics Reliability, 50(9-11):1479-1483, 2010. [doi]

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Lucio Rossi

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M. Riccio

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E. Napoli

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Andrea Irace

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Giovanni Breglio

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Paolo Spirito

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