BTI and leakage aware dynamic voltage scaling for reliable low power cache memories

Daniele Rossi, Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi. BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 194-199, IEEE, 2015. [doi]

Abstract

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