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Reliable Power Gating With NBTI Aging Benefits

Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi. Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. VLSI Syst., 24(8):2735-2744, 2016. [doi]

Authors

Daniele Rossi

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Vasileios Tenentes

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Sheng Yang

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S. Saqib Khursheed

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Bashir M. Al-Hashimi

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