Giovanni Daián Rottoli, Hernán Merlino, Ramón García-Martínez. Knowledge Discovery Process for Detection of Spatial Outliers. In Malek Mouhoub, Samira Sadaoui, Otmane Aït Mohamed, Moonis Ali, editors, Recent Trends and Future Technology in Applied Intelligence - 31st International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2018, Montreal, QC, Canada, June 25-28, 2018, Proceedings. Volume 10868 of Lecture Notes in Computer Science, pages 57-68, Springer, 2018. [doi]
Abstract is missing.