Philippe Royannez, Hugh Mair, Franck Dahan, Mike Wagner, Mark Streeter, Laurent Bouetel, Joel Blasquez, H. Clasen, G. Semino, Julie Dong, D. Scott, B. Pitts, Claudine Raibaut, Uming Ko. A design platform for 90-nm leakage reduction techniques. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 549-550, ACM, 2005. [doi]
Abstract is missing.