Pablo Royer, Fernando Garcia-Redondo, Marisa López-Vallejo. Evolution of radiation-induced soft errors in FinFET SRAMs under process variations beyond 22nm. In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2015, Boston, MA, USA, July 8-10, 2015. pages 112-117, IEEE, 2015. [doi]
Abstract is missing.