Aiwu Ruan, Bairui Jie, Li Wan, Junhao Yang, Chuanyin Xiang, Zujian Zhu, Yu Wang. A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs. Microelectronics Reliability, 54(8):1627-1635, 2014. [doi]
Abstract is missing.