A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis

Aiwu Ruan, Shi Kang, Yu Wang, Xiao Han, Zujian Zhu, Yongbo Liao, Peng Li. A Built-In Self-Test (BIST) system with non-intrusive TPG and ORA for FPGA test and diagnosis. Microelectronics Reliability, 53(3):488-498, 2013. [doi]

Abstract

Abstract is missing.