J. Ruan, G. J. Papaioannou, N. Nolhier, N. Mauran, M. Bafleur, Fabio Coccetti, Robert Plana. ESD failure signature in capacitive RF MEMS switches. Microelectronics Reliability, 48(8-9):1237-1240, 2008. [doi]
@article{RuanPNMBCP08,
title = {ESD failure signature in capacitive RF MEMS switches},
author = {J. Ruan and G. J. Papaioannou and N. Nolhier and N. Mauran and M. Bafleur and Fabio Coccetti and Robert Plana},
year = {2008},
doi = {10.1016/j.microrel.2008.06.035},
url = {http://dx.doi.org/10.1016/j.microrel.2008.06.035},
researchr = {https://researchr.org/publication/RuanPNMBCP08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1237-1240},
}