Oscar Ruano, Juan Antonio Maestro, Pedro Reviriego. Validation and optimization of TMR protections for circuits in radiation environments. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 399-400, IEEE, 2011. [doi]
@inproceedings{RuanoMR11-0,
title = {Validation and optimization of TMR protections for circuits in radiation environments},
author = {Oscar Ruano and Juan Antonio Maestro and Pedro Reviriego},
year = {2011},
doi = {10.1109/DDECS.2011.5783120},
url = {http://dx.doi.org/10.1109/DDECS.2011.5783120},
researchr = {https://researchr.org/publication/RuanoMR11-0},
cites = {0},
citedby = {0},
pages = {399-400},
booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011},
editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus},
publisher = {IEEE},
isbn = {978-1-4244-9755-3},
}