Markus Rudack, Dirk Niggemeyer. Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 31-39, IEEE Computer Society, 1999. [doi]
Abstract is missing.