Nataniel Ruiz, Adam Kortylewski, Weichao Qiu, Cihang Xie, Sarah Adel Bargal, Alan L. Yuille, Stan Sclaroff. Simulated Adversarial Testing of Face Recognition Models. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 4135-4145, IEEE, 2022. [doi]
Abstract is missing.