Carsten Rütz, Julien Schmaltz. An Experience Report on an Industrial Case-Study about Timed Model-Based Testing with UPPAAL-TRON. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 39-46, IEEE Computer Society, 2011. [doi]
Abstract is missing.