Designing an Associative Memory via Optimal Training for Fault Diagnosis

José Antonio Ruz Hernández, Edgar N. Sanchez, Dionisio A. Suarez. Designing an Associative Memory via Optimal Training for Fault Diagnosis. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2006, part of the IEEE World Congress on Computational Intelligence, WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006. pages 4338-4345, IEEE, 2006. [doi]

Abstract

Abstract is missing.