G. Rzepa, Wolfgang Gös, Ben Kaczer, Tibor Grasser. Characterization and modeling of reliability issues in nanoscale devices. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2445-2448, IEEE, 2015. [doi]
Abstract is missing.