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Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations

Diane-Perle Sadik, Juan Colmenares, Jang-Kwon Lim, Mietek Bakowski, Hans-Peter Nee. Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations. IEEE Transactions on Industrial Electronics, 68(3):2608-2616, 2021. [doi]

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