Albert Sadovnikov, Jarkko Vartiainen, Joni-Kristian Kämäräinen, Lasse Lensu, Heikki Kälviäinen. Detection of Irregularities in Regular Dot Patterns. In Proceedings of the IAPR Conference on Machine Vision Applications (IAPR MVA 2005), May 16-18, 2005, Tsukuba Science City, Japan. pages 380-383, 2005. [doi]
Abstract is missing.