David Saff. From developer s head to developer tests: characterization, theories, and preventing one more bug. In Richard P. Gabriel, David F. Bacon, Cristina Videira Lopes, Guy L. Steele Jr., editors, Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada. pages 811-812, ACM, 2007. [doi]
Abstract is missing.