Sriparna Saha, Sanghamitra Bandyopadhyay, Chingtham Tejbanta Singh. A new line symmetry distance based pattern classifier. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2008, part of the IEEE World Congress on Computational Intelligence, WCCI 2008, Hong Kong, China, June 1-6, 2008. pages 1425-1432, IEEE, 2008. [doi]
Abstract is missing.