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Sayandeep Saha, Dirmanto Jap, Sikhar Patranabis, Debdeep Mukhopadhyay, Shivam Bhasin, Pallab Dasgupta. Automatic Characterization of Exploitable Faults: A Machine Learning Approach. IACR Cryptology ePrint Archive, 2017:1008, 2017. [doi]