Reliability assessment of backward error recovery for SRAM-based FPGAs

Fouad Sahraoui, Ghaffari Fakhreddine, Mohamed El Amine Benkhelifa, Bertrand Granado. Reliability assessment of backward error recovery for SRAM-based FPGAs. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 248-252, IEEE, 2014. [doi]

Abstract

Abstract is missing.