Vaibhav Saini, Hitesh Sajnani, Cristina V. Lopes. Comparing Quality Metrics for Cloned and Non Cloned Java Methods: A Large Scale Empirical Study. In 2016 IEEE International Conference on Software Maintenance and Evolution, ICSME 2016, Raleigh, NC, USA, October 2-7, 2016. pages 256-266, IEEE Computer Society, 2016. [doi]
Abstract is missing.