Shigeki Saito, Hideo Himeno, Kunio Takahashi, Tadao Onzawa. Electrostatic detachment of a micro-object from a probe by applied voltage. In IEEE/RSJ International Conference on Intelligent Robots and Systems, Lausanne, Switzerland, September 30 - October 4, 2002. pages 1790-1795, IEEE, 2002. [doi]
Abstract is missing.