Koji Sakui, Daniele Garbin, Yoshihisa Iwata, Gautam Gaddemane, Yisuo Li, Yiqun Wan, Ken'ichi Kanazawa, Eyup Can Demir, Iwao Kunishima, Andrea Fantini, Masakazu Kakumu, Christophe Lorant, Nozomu Harada. Dynamic Flash Memory Operation Experimentally Validated with 65nm SOI Technology. In IEEE International Memory Workshop, IMW 2025, Monterey, CA, USA, May 18-21, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.