Detection of local stiffness and piezoelectric properties of materials via piezoresponse force microscopy

Amin Salehi-Khojin, Saeid Bashash, Nader Jalili, Gary Lee Thompson, Alexey Vertegel. Detection of local stiffness and piezoelectric properties of materials via piezoresponse force microscopy. In American Control Conference, ACC 2009. St. Louis, Missouri, USA, June 10-12, 2009. pages 985-990, IEEE, 2009. [doi]

Abstract

Abstract is missing.