A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow

Rami F. Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis. A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. In IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011. pages 231-236, IEEE, 2011. [doi]

Abstract

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