Colin Samplawski, Erik G. Learned-Miller, Heesung Kwon, Benjamin M. Marlin. Zero-Shot Learning in the Presence of Hierarchically Coarsened Labels. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 4015-4019, IEEE, 2020. [doi]
Abstract is missing.