Chiara Sandionigi, Mauricio Altieri, Olivier Héron. Early estimation of aging in the design flow of integrated circuits through a programmable hardware module. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017, Cambridge, United Kingdom, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.